职位描述：
job description
• test program and test hardware (load board, prober card) development for automatic test systems (ate) to the evaluation, characterization and production of wireless communication soc chip products.
• definition of test concept, work out test specification, generate test pattern in co-operation with ic design engineers.
• cooperate with chip designers, dft engineer, product engineer and technology engineers regarding test evaluation, analysis and debugging of first silicon and redesigns.
• maintain and optimize test package during ramp-up and volume production.
requirements:
• masters/bachelor's degree in electrical/electronics/computer engineering or in related field.
• industry experience in soc (device/wafer) test development.
• high speed interface (usb, ddr, mipi, digrf, etc.) and pmic test experience is a plus.
• tools skills:
experience with test platform such as advantest 93k or t2000 or teradyne j750.
knowledge of dft (design for test)
c++/c programming is required; scripting language (perl, pathon, etc.) knowledge is an advantage.
• fluent speaking and written english and good communication skills
• self-motivated team player